Zygo 6191-0584-01 interferometer
Product Details Introduction
Optical path difference measurement: The Zygo 6191-0584-01 interferometer is used to measure the optical path difference of a beam, usually achieved by dividing the beam into two paths and introducing a sample or test object in one path.
Precision measurement: The Zygo 6191-0584-01 interferometer is usually used for high-precision measurement applications, such as surface roughness measurement, shape measurement, thin film thickness measurement, etc.
Interference Image Generation: The Zygo 6191-0584-01 interferometer can generate interference images that display the phase difference of light and are used to analyze the characteristics of the test object.
Multi wavelength support: The Zygo 6191-0584-01 interferometer supports multiple wavelengths of light sources to meet different measurement needs.
White light interference: The white light Zygo 6191-0584-01 interferometer can be used for holographic interferometry measurement to obtain high-quality images of surface shape and contour.
Real time measurement: The Zygo 6191-0584-01 interferometer has real-time measurement capabilities and can be used for dynamic measurement and real-time monitoring.
Non contact measurement: The Zygo 6191-0584-01 interferometer is usually non-contact and can be used for sensitive material and surface measurements.
Automation support: In industrial automation, the Zygo 6191-0584-01 interferometer can be integrated with automation systems to achieve automated control and production processes.
Data analysis: The Zygo 6191-0584-01 interferometer is usually equipped with data analysis software for processing and analyzing measurement data.
Application field: The Zygo 6191-0584-01 interferometer is widely used in industrial manufacturing, material science, optical research, medical equipment manufacturing, semiconductor manufacturing, and other fields.
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