Zygo 8080-0338-01 interferometer
Product Details Introduction
Optical path difference measurement: The Zygo 8080-0338-01 interferometer is usually used to measure optical path difference to determine the reflection or refraction of light waves on the surface of the tested sample, thereby obtaining surface shape and height information.
High resolution: These instruments typically provide high-resolution measurement results, capable of detecting small surface features and elevation changes.
Non contact measurement: The Zygo 8080-0338-01 interferometer typically uses non-contact measurement methods without the need for physical contact with the tested sample to prevent contamination or damage to the sample.
Multi wavelength measurement: The Zygo 8080-0338-01 interferometer supports multi wavelength measurement, allowing measurements to be performed at different wavelengths to obtain more information.
Surface flatness measurement: These instruments are typically used to measure surface characteristics such as surface flatness, surface roughness, and surface flatness.
Real time monitoring: The Zygo 8080-0338-01 interferometer has a real-time monitoring function, which can display measurement results and visualize data in real time.
Data analysis and reporting: The Zygo 8080-0338-01 interferometer typically has data analysis tools and report generation functions for processing and presenting measurement data.
Temperature stability: The instrument has temperature stability to ensure the accuracy of measurements under different temperature conditions.
Customizability: The Zygo 8080-0338-01 interferometer typically allows users to customize and configure according to specific application needs.
Widely used: They are widely used in fields such as optics, semiconductors, manufacturing, medical equipment, aerospace, etc.
Product picture display
Related products:
E4809-032-219-H Industrial Keyboard
Reviews
There are no reviews yet.